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IEEE Std C135.61-1997 IEEE Standard for the Testing of Overhead Transmission and Distribution Line Hardware Sponsor Transmission and Distribution Committee of the IEEE Power Engineering Society Approved 16 September 1997 IEEE Standards Board Abstract: Requirements for mechanically testing load-rated line hardware for use on transmis- sion and distribution facilities are described. Items specifically addressed in this standard include clevis and eye fittings, Y-clevis fittings, socket fittings, ball fittings, chain links, shackles, triangular and rectangular yoke plates, suspension clamps, and strain clamps. This standard is intended to cover routine acceptance testing. It is not intended for initial design tests. Keywords: acceptance testing, load-rated line hardware The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright © 1998 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1998. Printed in the United States of America. ISBN 1-55937-967-7 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. it is reasonable to conclude that its contents. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. Use of an IEEE Standard is wholly voluntary. NJ 08855-1331 USA Note: Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. measure. 222 Rosewood Drive. The existence of an IEEE Standard does not imply that there are no other ways to produce. 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IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. regardless of membership afÞliation with IEEE. The standard covers routine acceptance testing. iii . Burtelson Nunally Johnson Dick Serocki Rick Chapel Ralph Jones Chris Severs Bill Cundiff Ed Kiernozek Doug Sherman Edward Dziedzic David J. Mitchell Glen Smith Dale A. Rumble Don Cannon Samy Krishnasamy Donald Sandell Vernon L. Ward Edwin J. Smith John Farrington Abdul M. Nicholls Dave Sunkle John E. Taylor George Gela Mark Ostendorp John Torok Donald A. Ferguson Jay L. Koury John S. Consalvo Keith E. Davidson Mike McCafferty Mohamed H. Hensel Jerry L. D. Maruvada Chris Severs Glenn A. Latham Neil P. Oedemann. Applequist Richard W. Quinn James E. Kluge Joseph Renowden James J.) This standard covers the requirements for the testing and acceptance of transmission and distribution line hardware.61-1997. the Working Group on Pole-Line Hardware of the Transmis- sion and Distribution Committee of the IEEE Power Engineering Society had the following membership: Ronald J. Peters William B. Pasha Thomas L. Annas Donald G. Chair Nick S. Goodwin Mohammad A. Oswald Daniel J. At the time that this standard was completed. Reding James E. Flynn Ronald J. Zollars Patrick D. Lindsey Ron Spees John Farrington Andy Meyer John Trostle John E. IEEE Standard for the Testing of Overhead Transmission and Distribution Line Hardware. Annas Richard W. Quinn Copyright © 1998 IEEE. Rodick Frederick W. Buch Robert O. Weaver Stan Grzybowski Robert C. Applequist Christopher Hickman Dennis Reisinger Joseph F. Heald Parvez Rashid Nick S. All rights reserved. Alderton Donald G. Douglass Hideki Motoyama Stephen F. Croker Sarma P. Chartier Robert C. Burtelson David J. ScholÞeld William T. Schmidt Leonard F. Hensel Steve D. Heald Patrick D. ScholÞeld Frederick W. Flynn Tom Murphy Nevins Wilburn Robert C. Gillies Robert G. Shwehdi Dennis Doss J.Introduction (This introduction is not part of IEEE Std C135. Koury Steve Smith Dale Easley Keith E. Mousa Gary E. Stemler Jon M. Oedemann Richard B. Peters The following persons were on the balloting committee: Tomas J. and is not intended for use for initial design tests. Lindsey Steve D. Burke Nestor Kolcio Stephen J. Ryan Jim Isaak Marco W. . Loughry. Diamond Robert Kennelly Gerald H. McCall Ingo RŸsch Donald N. Chair Richard J. Aggarwal Alan H. ÒAlÓ Kiener John W. Secretary Clyde R. Migliaro Chee Kiow Tan Ben C. Johnson Howard L. All rights reserved. Pope Donald C. Reimer Thomas F. Fleckenstein Joseph L. Peterson Harold E. Holleman. Garrity Lawrence V. Salem. G. KoepÞnger* Jose R. Epstein E. Lambert Ronald H. Vice Chair Andrew G. Cookson Adam Sicker IEEE Standards Project Editor iv Copyright © 1998 IEEE. Ramos Jay Forster* Stephen R. Bruce McClung John S. Heirman L. it had the following mem- bership: Donald C.When the IEEE Standards Board approved this standard on 16 September 1997. Wolfman *Member Emeritus Also included are the following nonvoting IEEE Standards Board liaisons: Satish K. Camp Lowell Johnson Loius-Fran•ois Pau Stephen L. ..................................................................................................... Technical definitions......................................................................................Contents 1...3 Application........................................... 1 1................................................................................................... Overview................................................ References............ 2 5............................ Requirements ..... 3 Copyright © 1998 IEEE........................... 3 6............................................................ v ............................................................................................................................... 1 2........................................................................ Test procedure and test reports ..........................................1 Scope................................................. All rights reserved......... 1 3............ 1 1............................................................................... 1 1................................ Determination of acceptability.................................................................................................................... 2 4..........................................................................2 Purpose...................................................... ANSI/ASQC Z1.1 Scope This standard covers the requirements for mechanically testing load-rated line hardware for use on transmis- sion and distribution facilities. Y-clevis Þttings. based on experience and a knowledge of the associated codes and materials involved. triangular and rectangular yoke plates. NY 10036. 1 . This standard may be applied to other line hardware as agreed upon by the manufacturer and the end user. Assurance of compliance with this standard is a matter to be agreed upon by the purchaser and the supplier.IEEE Standard for the Testing of Overhead Transmission and Distribution Line Hardware 1. All rights reserved. 1. This standard is intended to cover routine acceptance testing. Copyright © 1998 IEEE. clevis and eye Þt- tings. American National Standards Institute. References This standard shall be used in conjunction with the following publication. 2. the revision shall apply. Sampling Procedures and Tables for Inspection by Attributes. socket Þttings. meet the acceptance criteria in Clause 5. USA. chain links. suspension clamps. It is expected that the user will select suitable safety factors in applying these devices.1 1ANSI publications are available from the Sales Department. This standard speciÞcally addresses. 11 West 42nd Street.3 Application The routine acceptance tests covered by this standard test the Òas-manufacturedÓ condition of the product. ball Þttings. New York.4-1993. When the following publication is superseded by an approved revision. 13th Floor. in all respects. Overview 1. and strain clamps.2 Purpose All load-rated line hardware conforming to the requirements of this standard shall. shackles. 1. It is not intended for initial design tests. when tested in accordance with the procedures outlined in Clause 6. but is not limited to. Definitions 3. as far as is practicable. where applica- ble. ..IEEE Std C135. 2 Copyright © 1998 IEEE. Each lot. for the purpose of a sampling inspection. when tested. the units of sample being selected at random without regard to their quality. 3. 3. can be considered satisfactory as a process average. when tested. + X n ) ¤ n where X1. falls below its speciÞed rated ultimate strength. shall consist of units of prod- uct of a single type. a defect is deÞned as a unit of product that.Xn.5% (see ANSI/ASQC-1993). Table 1ÑMinimum sample size Lot size Sample size 1Ð29 3 30Ð150 5 151Ð1200 13 1201Ð10 000 20 10 001Ð35 000 32 4.3 defect: Any nonconformance with speciÞed requirements of the tested unit of product. 3.. Any lot shall not exceed 35 000 units. 3. Requirements The inspection criteria used in this standard correspond to sample size code S-4 with a double sampling plan for normal inspection having an aql of 2. 3. falls below 85% of its speciÞed rated ultimate strength. Minimum sample sizes are given in Table 1. Consideration should be given to limit the lot size.4 lot: A quantity of line hardware selected and agreed upon by the manufacturer and customer as being representative of a homogeneous population. As necessary.6 sample: One or more units of product drawn from a lot.61 -1997 IEEE STANDARD FOR THE TESTING OF OVERHEAD 3... For purposes of this standard. the manufacturer shall provide adequate and suitable storage space for each lot and means for proper identiÞcation. size.5 major defect: A unit of product that. and composition that are manufactured at essentially the same time and under essentially the same conditions. 3.. X2. grade. class. are individual test values and n is the total number of units tested.1 acceptance quality level (aql): The maximum percent defective (maximum number of defects per 100 units) that.2 average test value ( X n ): X n = ( X 1 + X 2 + X 3 + . to each heat-treating and/or annealing process of a group of units. All rights reserved..7 sample size: Based on the lot size. Pins or bolts that are normally furnished with the hardware shall be used during all tests. Load shall then be smoothly applied at a rate of 25% of rated strength per minute. All rights reserved. the lot shall be rejected without a second sampling being allowed. This standard applies to straight-line loading. All tests shall be recorded in a permanent and organized manner. c) Catalog part number.e. If the number of defects found in the Þrst sample is between the Þrst acceptance and rejection num- bers. a second sampling of the size given in Table 1 shall be tested. Table 2ÑAcceptance/rejection criteria Test sample Sample size Cumulative sample size Accept Reject Single 3 Ñ 0 1 Single 5 Ñ 0 1 First 13 13 0 2 Second 13 26 1 2 First 20 20 0 3 Second 20 40 3 4 First 32 32 1 4 Second 32 64 4 5 The lot shall be considered acceptable when the number of defects found in the Þrst (or single) sample is equal to or less than the Þrst acceptance number from Table 2. 6. Copyright © 1998 IEEE. the load shall be started at zero and shall be brought up smoothly in a practically stepless manner. If this acceptance criterion is met on the Þrst sampling. until the point of failure. the lot shall be rejected. and shall be maintained for a minimum of 10 years. b) Location of test. Both the manufacturer and the end user shall reserve the right to reject the entire lot if a tested unit of prod- uct is found to have a major defect (i.61-1997 5. If the number of defects found in the Þrst or single sample is equal to or greater than the Þrst rejection number. Test procedure and test reports Pulling hardware used in the application of the load shall be dimensional according to Exhibits AÐD (see Figures 1Ð5). The load may be increased rapidly to approximately 75% of the rated strength of the hard- ware. If the cumulative number of defects is equal to or less than the second acceptance number. 3 . falls below 85% rated ultimate strength). The number of defects found in the Þrst and second samples shall be accumulated. IEEE TRANSMISSION AND DISTRIBUTION LINE HARDWARE Std C135. the lot shall be considered acceptable. Determination of acceptability The acceptability of a lot shall be determined by the use of Table 2. d) Hardware rating. In performing a tensile test.. Lower ultimate strengths may occur if loaded in a manner other than shown in this standard. Each test write-up shall contain the following: a) Date of test. a second sampling is not needed. If the cumulative number of defects is equal to or greater than the second rejection number. b) Location of test. g) Any pertinent notes. 4 Copyright © 1998 IEEE. j) Average test value ( X n ). Xn).. c) Supplier catalog part number. including serial number of test equipment. e) Object of test. k) A statement that the hardware conforms. etc. secu- rity shall be employed so that only the person witnessing the test may enter or alter the results..61 -1997 IEEE STANDARD FOR THE TESTING OF OVERHEAD e) Description of test setup. fracture at clevis. i) Name of the inspector performing or witnessing the test. l) Personnel present at the test. to the requirements of this standard. and a description of the failure (i. m) Signature of certiÞcation.IEEE Std C135.. All test reports submitted to customers shall be typed and certiÞed. . fracture at clevis. including test equipment serial number and last date of calibra- tion. and a description of the failure (broken pin. All rights reserved. f) Date of last calibration of test equipment. X2.. Each test report shall contain the follow- ing: a) Date of test. d) Description of the part including hardware rating.). If any electronic data base is utilized. etc. h) Test values at which failure occurred. or does not conform. g) Description of the test equipment. i) Test values at which failure occurred (X1. h) Number of units tested (n).. broken pin.e.). f) Test procedure. 61-1997 A ITEM BEING P X TESTED P X W W C C BEVELED OR ROUNDED EDGE Z Z D P/2 P/2 P/2 P/2 B B Y CLEVIS AND EYE FITTINGS Y W = C + [2 mm (1/16 in) to 3 mm (1/8 in)] X = A Ð [2 mm (1/16 in) to 3 mm (1/8 in)] Y-CLEVIS FITTINGS Y = B + [2 mm (1/16 in) to 3 mm (1/8 in)] Z = D Ð [2 mm (1/16 in)] W = C + [3 mm (1/8 in) to 5 mm (3/16 in)] X = A Ð [0 mm (0 in) to 6 mm (1/4 in)] P Y = B + [2 mm (1/16 in) to 3 mm (1/8 in)] Z = D Ð [2 mm (1/16 in)] HARDENED BALL FITTING OF APPROPRIATE SIZE FOR CLASS OF SOCKET P ITEM BEING TESTED P HARDENED SOCKET BALL FITTING FITTING OF APPROPRIATE P SIZE FOR CLASS OF BALL SOCKET FITTING Figure 1ÑExhibit ÒAÓ Copyright © 1998 IEEE. All rights reserved. IEEE TRANSMISSION AND DISTRIBUTION LINE HARDWARE Std C135. 5 . .IEEE Std C135. All rights reserved.61 -1997 IEEE STANDARD FOR THE TESTING OF OVERHEAD A D P P D = A + [0 mm (0 in) to 3 mm (1/ CHAIN LINKS ITEM BEING TESTED P D B X P D = A + [0 mm (0 in) to 3 mm (1/8 in)] W = C + [2 mm (1/16 in) to 3 mm (1/8)] A C X =BÐ[5mm(3/16in)to6mm(1/4in)] W SHACKLES PINS SIZED FOR INTENDED APPLICATION P P RECTANGULAR YOKES Figure 2ÑExhibit ÒBÓ 6 Copyright © 1998 IEEE. IEEE TRANSMISSION AND DISTRIBUTION LINE HARDWARE Std C135.61-1997 PINS SIZED FOR INTENDED APPLICATION (ALL LOCATIONS) 50 mm (2 in) MAXIMUM STRAPS MUST BE LOOSE LEAVE 3 mm (1/8 in) MINIMUM GAP BETWEEN YOKES AND STRAPS (ALL LOCATIONS) P W P YOKE BEING 2/3 W TESTED MINIMUM PINS SIZED FOR INTENDED APPLICATION P P YOKE BEING TESTED TRIANGULAR YOKES (EITHER METHOD) Figure 3ÑExhibit ÒBÓ (continued) Copyright © 1998 IEEE. 7 . All rights reserved. 61 -1997 IEEE STANDARD FOR THE TESTING OF OVERHEAD P NOTEÑREFER TO ITEM BEING TESTED EXHIBIT ÒAÓ FOR MAY BE TESTED WITHOUT CLEVIS EYE FITTING KEEPER AND U-BOLTS SIDE CLEARANCE A FLEXIBLE CABLE WIRE WIRE +0 TENSIONED A = MAXIMUM TAKE-OFF ANGLE TENSIONED Ð3 MEASURED AT 50% ULTIMATE 1/2 P SUSPENSION CLAMPS 1/2 P ITEM BEING TESTED P P NOTEÑREFER TO EXHIBIT ÒAÓ FOR CLEVIS EYE FITTING SIDE CLEARANCE 22.IEEE Std C135. All rights reserved. .2 mm (7/8 in) DIAMETE MAXIMUM QUADRANT STRAIN CLAMPS Figure 4ÑExhibit ÒCÓ 8 Copyright © 1998 IEEE. All rights reserved. 9 .1 mm (3/4 in) DIAMETER MAXIMUM STRAIGHT-LINE DEADEND CLAMP Figure 5ÑExhibit ÒDÓ Copyright © 1998 IEEE. IEEE TRANSMISSION AND DISTRIBUTION LINE HARDWARE Std C135.61-1997 ITEM BEING TESTED P P 19. m. 732.ieee. 981.Ð4:30 p. 981.m. 0035 ISBN 1-55937-967-7 . 981. 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